In general, MT BF is a measure of reliability, whereas MT TF is a measure of longevity. MT BF is the average time a product or component will work without any issues or failures, whereas MT TF is the average time a product or component will fail. MT BF ( Me an Time Between Fail ures ) and MT TF ( Me an Time To Failure ) are two terms used to measure the average lifetime of a product or component. The appropriate number should be considered case-by-case and varies depending on the asset, use case, environment, and the maintenance program that is in place. The goal should be to have a high average time between failures, indicating good health. It helps to plan around this so that when a failure does happen, you can respond with the correct asset management strategy. This translates into lower costs associated with repairs and unplanned downtime.Ī lower MTBF output means you will likely experience a more frequent failure rate. What the results meanĪ high MTBF output means fewer problems with your equipment will occur over its lifetime. It may include any failure, including mechanical, electrical, software, or human error. Total breakdowns are the number of times the equipment has failed while running. It includes both planned maintenance tasks and unplanned repair time. Typically this is measured in operating hours. Total operational time is the period your equipment runs without any breakdowns. The following formula is used to calculate MTBF: Total Operational Time / Total Number of Breakdowns = MTBF (hrs.) Many companies aim to maximize output and minimize downtime during regular operating hours. ATP is committed to deliver high-performance and high-endurance NAND flash storage products to ensure the best value for total cost of ownership (TCO).įor more information on ATP’s testing processes and for customization requests, visit the ATP website or contact an ATP Representative.For many organizations, knowing MTBF metrics helps assess the reliability of the systems that support your business operations. All SSDs ATP complete the RDT without issues or data miscompare.ĪTP’s Reliability Demonstration Test is part of the many reliability and endurance tests developed and performed by ATP to ensure strict compliance to the highest standards of quality. ATP performs RDT according to JEDEC standards to determine drive reliability, and uses the Arrhenius equation to calculate thermal acceleration factors for semiconductor device time-to-failure distributions. The resulting MTBF is 2,084,689 hours at 55☌ with 60% confidence.ĪTP performs exhaustive actual drive-level testing on its SSDs over extended periods of time to validate the rated MTBF value instead of relying on reliability prediction systems. After applying the Acceleration Factor (AF=2.84), the cumulative Tuse hours is 1,910,181 hours. The cumulative power on hours for all the drives was over 671,760 hours. The Arrhenius equation is implemented to calculate thermal acceleration factors for semiconductor device time-to-failure distributions. All SSDs completed the RDT without issues or data miscompare. Sequential/Transfer Size: 128K/256K/512KĪTP performed RDT on SATA M.2 2280 SSDs of various capacities.The following figure shows the RDT test conditions and process flow with respective Sequential and Random workload/transfer sizes. This standard aims to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic components JESD91A: Method for Developing Acceleration Models for Electronic Component Failure Mechanisms.JEP150.01: Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid-State Surface-Mount Components.These workloads are used in conjunction with JESD218. This standard defines workloads for the endurance rating and endurance verification of SSD application classes. JESD219: Solid State Drive (SSD) Endurance Workloads.This standard defines the conditions of use and the corresponding endurance verification requirement for each defined SSD class. JESD218: Solid State Drive (SSD) Requirements and Endurance Test Method.It is an important gauge for determining drive availability and reliability and is very useful in preparing for unplanned maintenance.ĪTP RDT is performed according to following JEDEC standards: MTBF is a maintenance metric that measures the expected average time (in hours) between device failures. Instead of providing MTBF simulation results based on MIL-HDBK-217F, Telcordia SR-332, and other reliability prediction systems, ATP Electronics conducts actual drive-level testing to validate the rated MTBF value. All testing parameters aim to validate the mean time between failures (MTBF) rating of the drive. Reliability Demonstration Test (RDT) is a rigorous test performed on ATP solid state drives (SSDs) over extended periods of time to demonstrate that each SSD meets the strictest quality requirements.
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